XRF Webinar: Small spot analysis and mapping with a new WDXRF spectrometer

Mapping screen

You are invited to discover how easy and quick you can pinpoint focus on specimen sections and get an immediate answer to your analytical problem using the new Thermo Scientific ARL PERFORM’X XRF spectrometer and its two advanced capabilities:

Small spot analysis
- Narrow spot analysis with selectable X-ray beam diameters of 1.5 mm or 0.5 mm for unique sample sizes and shapes
- Full quantification when combined with Thermo Scientific UniQuant standard-less analysis software for a high precision
semi-quantitative analysis
- Ideal for samples in jewellery, forensics, automotive and many R&D applications increasing your laboratories capabilities
Mapping
- Characterization of elemental impurities, inclusions and gradients that are unidentifiable by other methods
- Construction of detailed composite maps of element distribution within complex, non-homogeneous samples adding a new
dimension of information
- Ideal for materials engineering applications in various industries for R&D and process improvement

Event Date: December 7, 2011
Event Time: 07:30 am EDT/14:30 GMT/UTC
Event Duration: 40 Minutes

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