Presenting New Levels of Efficiency and New Material Development

Introducing the new K-Alpha+ XPS Spectrometer

Learn about the latest advances in XPS technology. Using real-world examples, we demonstratre how the features of the new K-Alpha+ XPS spectrometer make surface analysis more efficient, more productive, and applicable to even larger applications and new materials.

Date:
Tuesday, November 4, 2014

Times:
Session 1: 8 a.m. EST / 13:00 p.m. (GMT)
Session 2: 1 p.m. EST / 18:00 p.m. (GMT)

Duration:
40 minutes with 20 minutes for Q&A

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