Presenting New Levels of Efficiency and New Material Development

Introducing the new K-Alpha+ XPS Spectrometer Learn about the latest advances in XPS technology.

Using real-world examples, we demonstratre how the features of the new K-Alpha+ XPS spectrometer make surface analysis more efficient, more productive, and applicable to even larger applications and new materials.

Date:
Tuesday, July 22, 2014

Time:
Session 1: 8 a.m. EDT / 12:00 p.m. (GMT)
Session 2: 1 p.m. EDT / 17:00 p.m. (GMT)

Duration:
40 Minutes with 20 minutes Q&A

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