Going to ImagineNano/Graphene 2013 in Bilbao, Spain?
Please join us for a complimentary workshop on graphene characterization with Raman and XPS offered in conjunction with the conference.

Graphene and graphene-based materials, such as graphene oxide, have impressive electrical, mechanical, chemical, and thermal properties. Development of new graphene-based products require materials characterization and analysis from the initial research stages through testing of the finished devices. Most materials need to be analyzed for compositional homogeneity across the sample surface and thickness through the sample. A complementary approach guides synthetic methods, material processing, and interrogating advanced composites containing these materials.

This presentation and hands-on workshop will demonstrate how Raman spectroscopy and X-ray photoelectron spectroscopy can be used to gain insight into graphene-based materials. The ability of these two techniques to provide complementary information on a range of material properties such as structural uniformity, film quality, degree of functionalization, and electrical properties will be presented.

Raman microscopy is well suited for the characterization of graphene. A vibrational technique, Raman is very sensitive to small changes in a molecule's geometric structure and or its environment. This sensitivity allows it to be used as a probe for a number of properties important to a specific graphene samples. These properties include but are not limited to the determination layer thickness, the presence or absence of defects and for measuring local strain on a sample.

X-ray photoelectron spectroscopy (XPS) provides quantitative elemental and chemical information with extremely high surface specificity and is ideal for comprehensively and quantitatively characterizing the composition and chemical bonding states at surfaces and interfaces.

Date: Thursday, April 25, 2013
Time: 3-6 p.m.
Location: Fifth floor, Room 2, Bilbao Exhibition Center; Bilbao, Spain