In materials science, XPS offers quantitative chemical state information at the sample surface. Depth profiling provides an understanding of how the chemistry can change at interfaces or into the bulk. A related technique, Ultra-Violet Photoelectron Spectroscopy (UPS) supplies complementary data to an XPS analysis by lowering the excitation energy. Now that UPS is available on the Thermo Scientific™ K-Alpha+ surface analysis system, we will introduce this powerful technique, and highlight the additional information it can provide through a series of example applications.
Duration:
45 minutes with an additional 15 minutes for Q&A